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[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Alpha-particle and neutron-induced single-event transient measurements in subthreshold circuits
Gadlage, Matthew J., Roach, Austin H., Duncan, Adam R., Halstead, Matthew R., Kay, Matthew J., Gadfort, Peter, Alhbin, Jonathan R., Stansberry, ScottYear:
2016
Language:
english
DOI:
10.1109/IRPS.2016.7574637
File:
PDF, 1.17 MB
english, 2016