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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Systems Contamination: Prediction, Control, and Performance 2016 - Hyperspectral instrumentation to image and characterize the fluorescence of materials
Egges, Joanne, Soares, Carlos E., Wooldridge, Eve M., Bourcier, Frédéric, Walter, Philippe, Pedetti, Silvia, Faye, Delphine, Spezzigu, Piero, Infante, Fulvio, Le Nouy, Patrice, Zedda, EdoardoVolume:
9952
Year:
2016
Language:
english
DOI:
10.1117/12.2235592
File:
PDF, 3.06 MB
english, 2016