Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C–SiC
Chavoshi, Saeed Zare, Luo, XichunVolume:
6
Year:
2016
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/c6ra05830b
File:
PDF, 4.65 MB
english, 2016