Atomic-scale characterization of occurring phenomena during...

Atomic-scale characterization of occurring phenomena during hot nanometric cutting of single crystal 3C–SiC

Chavoshi, Saeed Zare, Luo, Xichun
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Year:
2016
Language:
english
Journal:
RSC Adv.
DOI:
10.1039/c6ra05830b
File:
PDF, 4.65 MB
english, 2016
Conversion to is in progress
Conversion to is failed