Multiple Coulomb scattering in thin silicon

Journal of Instrumentation 2014 / 07 Vol. 9; Iss. 7

Multiple Coulomb scattering in thin silicon

Berger, N, Buniatyan, A, Eckert, P, Förster, F, Gredig, R, Kovalenko, O, Kiehn, M, Philipp, R, Schöning, A, Wiedner, D
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Volume:
9
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/9/07/P07007
Date:
July, 2014
File:
PDF, 841 KB
english, 2014
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