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[IEEE 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Berlin, Germany (2016.9.6-2016.9.9)] 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Industrial process monitoring by means of recurrent neural networks and Self Organizing Maps
Zurita, Daniel, Sala, Enric, Carino, Jesus A., Delgado, Miguel, Ortega, Juan A.Year:
2016
Language:
english
DOI:
10.1109/ETFA.2016.7733534
File:
PDF, 551 KB
english, 2016