[IEEE 2016 Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC) - Cairo, Egypt (2016.5.31-2016.6.2)] 2016 Fourth International Japan-Egypt Conference on Electronics, Communications and Computers (JEC-ECC) - New testability analysis and multi-frequency test set compaction method for analogue circuits
Saleh, Mohamed S., El-Mahlawy, Mohamed H., Hassan, Hossam E. Abou-BakrYear:
2016
Language:
english
DOI:
10.1109/jec-ecc.2016.7518961
File:
PDF, 431 KB
english, 2016