[IEEE 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro) - Belo Horizonte, Brazil (2016.8.29-2016.9.3)] 2016 31st Symposium on Microelectronics Technology and Devices (SBMicro) - Back enhanced (BE) SOI pMOSFET behavior at high temperatures
Yojo, Leonardo, Padovese, Jose A., Rangel, Ricardo C., Martino, Joao A.Year:
2016
Language:
english
DOI:
10.1109/SBMicro.2016.7731358
File:
PDF, 366 KB
english, 2016