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A Novel Cache-Utilization-Based Dynamic Voltage-Frequency Scaling Mechanism for Reliability Enhancements
Chen, Yen-Hao, Tang, Yi-Lun, Liu, Yi-Yu, Wu, Allen C.-H., Hwang, TingTingYear:
2016
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2016.2614993
File:
PDF, 4.34 MB
english, 2016