Plasmon–exciton interaction and screening of exciton in ZnO-based thin film on bulk Pt as analyzed by spectroscopic ellipsometry
Darma, Yudi, Satrya, Christoforus Dimas, Marlina, Resti, Kurniawan, Robi, Herng, Tun Seng, Ding, Jun, Rusydi, AndrivoVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.01AD06
Date:
January, 2017
File:
PDF, 1.14 MB
english, 2017