Analysis of aging effects - From transistor to system level

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Microelectronics Reliability 2016 / 11

Analysis of aging effects - From transistor to system level

Taddiken, Maike, Hellwege, Nico, Heidmann, Nils, Peters-Drolshagen, Dagmar, Paul, Steffen
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.10.016
Date:
November, 2016
File:
PDF, 1.58 MB
english, 2016
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