Spectroscopic ellipsometry characterization of ZnO:Sn thin...

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Applied Surface Science 2016 / 10

Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering

Janicek, Petr, Niang, Kham M., Mistrik, Jan, Palka, Karel, Flewitt, Andrew J.
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Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2016.10.169
Date:
October, 2016
File:
PDF, 1.97 MB
english, 2016
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