Graphene-edge probes for scanning tunneling microscopy
Chu, Kevin K.W., Chen, Jeng Shiung, Chang, Li-Der, Tsai, Jeff T.H.Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2016.11.022
Date:
November, 2016
File:
PDF, 1.71 MB
english, 2016