Graphene-edge probes for scanning tunneling microscopy

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Graphene-edge probes for scanning tunneling microscopy

Chu, Kevin K.W., Chen, Jeng Shiung, Chang, Li-Der, Tsai, Jeff T.H.
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Language:
english
Journal:
Optik - International Journal for Light and Electron Optics
DOI:
10.1016/j.ijleo.2016.11.022
Date:
November, 2016
File:
PDF, 1.71 MB
english, 2016
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