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Defect mediated exchange bias in oriented (111) Fe3O4/(100) GaAs
Bhat, Shwetha G., Kumar, P. S. AnilLanguage:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2016.11.022
Date:
November, 2016
File:
PDF, 765 KB
english, 2016