[IEEE 2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Wroclaw, Poland (2016.9.5-2016.9.9)] 2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Simulation of bulk current injection test using integrated circuit immunity macro model and electromagnetic analysis
Kondo, Yosuke, Ueyama, Shinichiro, Izumichi, Masato, Wada, OsamiYear:
2016
Language:
english
DOI:
10.1109/EMCEurope.2016.7739263
File:
PDF, 617 KB
english, 2016