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Maintaining strength in supersaturated copper–chromium thin films annealed at 0.5 of the melting temperature of Cu
Raghavan, R., Harzer, T. P., Djaziri, S., Hieke, S. W., Kirchlechner, C., Dehm, G.Volume:
52
Language:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-016-0386-6
Date:
January, 2017
File:
PDF, 2.52 MB
english, 2017