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Systematic method for electrical characterization of random telegraph noise in MOSFETs
Marquez, Carlos, Rodriguez, Noel, Gamiz, Francisco, Ohata, AkikoLanguage:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.10.031
Date:
October, 2016
File:
PDF, 3.11 MB
english, 2016