Temperature and data size trade-off in dictionary based...

Integration, the VLSI Journal 2017 / 03 Vol. 57

Temperature and data size trade-off in dictionary based test data compression

Karmakar, Rajit, Chattopadhyay, Santanu
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Volume:
57
Language:
english
Journal:
Integration, the VLSI Journal
DOI:
10.1016/j.vlsi.2016.11.002
Date:
March, 2017
File:
PDF, 1.60 MB
english, 2017
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