[IEEE 2016 74th Annual Device Research Conference (DRC) - Newark, DE, USA (2016.6.19-2016.6.22)] 2016 74th Annual Device Research Conference (DRC) - Extremely high simulated ballistic currents in triple-heterojunction tunnel transistors
Long, Pengyu, Povolotskyi, Michael, Huang, Jun Z., Ilatikhameneh, Hesameddin, Ameen, Tarek, Rahman, Rajib, Kubis, Tillmann, Klimeck, Gerhard, Rodwell, Mark J. W.Year:
2016
Language:
english
DOI:
10.1109/DRC.2016.7548424
File:
PDF, 453 KB
english, 2016