Characterization and Modeling of NBTI in Nanoscale...

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IEEE Transactions on Electron Devices 2016

Characterization and Modeling of NBTI in Nanoscale UltraThin Body UltraThin Box FD-SOI MOSFETs

Karatsori, Theano A., Theodorou, Christoforos G., Haendler, Sebastien, Planes, Nicolas, Ghibaudo, Gerard, Dimitriadis, Charalabos A.
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2016.2620720
File:
PDF, 1012 KB
english, 2016
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