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[IEEE 2015 IEEE 12th Intl Conf on Ubiquitous Intelligence and Computing and 2015 IEEE 12th Intl Conf on Autonomic and Trusted Computing and 2015 IEEE 15th Intl Conf on Scalable Computing and Communications and Its Associated Workshops (UIC-ATC-ScalCom) - Beijing, China (2015.8.10-2015.8.14)] 2015 IEEE 12th Intl Conf on Ubiquitous Intelligence and Computing and 2015 IEEE 12th Intl Conf on Autonomic and Trusted Computing and 2015 IEEE 15th Intl Conf on Scalable Computing and Communications and Its Associated Workshops (UIC-ATC-ScalCom) - The Bimodal Probability Density Distribution of the Survivability for Wireless Sensor Networks under Random Failures
Lv, Yan, Huangfu, Wei, Zhang, ZhongshanYear:
2015
Language:
english
DOI:
10.1109/uic-atc-scalcom-cbdcom-iop.2015.61
File:
PDF, 1.20 MB
english, 2015