Schottky nanocontact of one-dimensional semiconductor nanostructures probed by using conductive atomic force microscopy
Lee, Jung Ah, Lim, Young Rok, Jung, Chan Su, Choi, Jun Hee, Im, Hyung Soon, Park, Kidong, Park, Jeunghee, Kim, Gyu TaeVolume:
27
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/27/42/425711
Date:
October, 2016
File:
PDF, 1.69 MB
english, 2016