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[IEEE 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Altai Republic, Russia (2016.6.30-2016.7.4)] 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Laser monitor for imaging of the processes located at different distances
Trigub, Maxim V., Fedorov, Kirill V., Vlasov, Vasiliy V., Evtushenko, Gennadiy S.Year:
2016
Language:
english
DOI:
10.1109/EDM.2016.7538744
File:
PDF, 765 KB
english, 2016