[IEEE 2016 3rd International Conference on Information Science and Control Engineering (ICISCE) - Beijing, China (2016.7.8-2016.7.10)] 2016 3rd International Conference on Information Science and Control Engineering (ICISCE) - TFT-LCD Mura Defect Detection Based on ICA and Multi-channels Fusion
Wang, Xiu, Dong, Rong, Li, BoYear:
2016
Language:
english
DOI:
10.1109/ICISCE.2016.152
File:
PDF, 593 KB
english, 2016