[IEEE 2016 IEEE 21st International Conference on Emerging...

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[IEEE 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - Berlin, Germany (2016.9.6-2016.9.9)] 2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation (ETFA) - A novel approach towards model-driven reliability analysis of Simulink models

Iyenghar, Padma, Wessels, Stephan, Noyer, Arne, Pulvermueller, Elke, Westerkamp, Clemens
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Year:
2016
Language:
english
DOI:
10.1109/etfa.2016.7733505
File:
PDF, 667 KB
english, 2016
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