SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Image Processing: Machine Vision Applications VI - Efficient defect detection with sign information of Walsh Hadamard transform
Zhang, Qiang, van Beek, Peter, Yuan, Chang, Xu, Xinyu, Seo, Hae-jong, Li, Baoxin, Bingham, Philip R., Lam, Edmund Y.Volume:
8661
Year:
2013
Language:
english
DOI:
10.1117/12.2004671
File:
PDF, 1.01 MB
english, 2013