SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging -...

  • Main
  • SPIE Proceedings [SPIE IS&T/SPIE...

SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Image Processing: Machine Vision Applications VI - Efficient defect detection with sign information of Walsh Hadamard transform

Zhang, Qiang, van Beek, Peter, Yuan, Chang, Xu, Xinyu, Seo, Hae-jong, Li, Baoxin, Bingham, Philip R., Lam, Edmund Y.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8661
Year:
2013
Language:
english
DOI:
10.1117/12.2004671
File:
PDF, 1.01 MB
english, 2013
Conversion to is in progress
Conversion to is failed