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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, USA (Sunday 3 February 2013)] Image Quality and System Performance X - Challenges of an automated spectral responsivity characterization system
McKee, Greg, Burns, Peter D., Triantaphillidou, SophieVolume:
8653
Year:
2013
Language:
english
DOI:
10.1117/12.2008606
File:
PDF, 208 KB
english, 2013