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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Novel Optical Systems Design and Optimization XIX - An automated imaging BRDF polarimeter for fruit quality inspection
Davis, Arthur J., Hahlweg, Cornelius F., Mulley, Joseph R., Boyer, Jacob, Keresztes, Janos C., Saeys, Wouter, Koshel, JohnVolume:
9948
Year:
2016
Language:
english
DOI:
10.1117/12.2239008
File:
PDF, 899 KB
english, 2016