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SPIE Proceedings [SPIE 2010 International Conference on Display and Photonics - Nanjing, China (Tuesday 13 July 2010)] 2010 International Conference on Display and Photonics - Research on reliability analysis of multi-state electrical systems based on Bayesian networks
Duan, Lizhao, Wu, Yanwen, Huang, Jingde, Hao, XueliangVolume:
7749
Year:
2010
Language:
english
DOI:
10.1117/12.871544
File:
PDF, 210 KB
english, 2010