Weak scratch detection and defect classification methods for a large-aperture optical element
Tao, Xian, Xu, De, Zhang, Zheng-Tao, Zhang, Feng, Liu, Xi-Long, Zhang, Da-PengLanguage:
english
Journal:
Optics Communications
DOI:
10.1016/j.optcom.2016.10.062
Date:
November, 2016
File:
PDF, 1.44 MB
english, 2016