Preparation and Analysis of Atom Probe Tips by Xenon...

Microscopy and Microanalysis 2016 / 06 Vol. 22; Iss. 3

Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling

Estivill, Robert, Audoit, Guillaume, Barnes, Jean-Paul, Grenier, Adeline, Blavette, Didier
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Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616000581
Date:
June, 2016
File:
PDF, 953 KB
english, 2016
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