Investigation of the p-GaN Gate Breakdown in Forward-biased...

  • Main
  • 2016
  • Investigation of the p-GaN Gate Breakdown in Forward-biased...

Investigation of the p-GaN Gate Breakdown in Forward-biased GaN-based Power HEMTs

Tallarico, Andrea Natale, Stoffels, Steve, Magnone, Paolo, Posthuma, Niels, Sangiorgi, Enrico, Decoutere, Stefaan, Fiegna, Claudio
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2016.2631640
File:
PDF, 776 KB
english, 2016
Conversion to is in progress
Conversion to is failed