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[IEEE 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - San Diego, CA, USA (2015.10.31-2015.11.7)] 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Blind analysis of CT image noise using residual denoised images
Roychowdhury, Sohini, Hollcraft, Nathan, Alessio, Adam M.Year:
2015
Language:
english
DOI:
10.1109/NSSMIC.2015.7582055
File:
PDF, 1.16 MB
english, 2015