Characterization of high resolution CMOS monolithic active...

Journal of Instrumentation 2015 / 05 Vol. 10; Iss. 5

Characterization of high resolution CMOS monolithic active pixel detector in SOI technology

Ahmed, M.I., Arai, Y., Glab, S., Idzik, M., Kapusta, P., Miyoshi, T., Takeda, A., Turala, M.
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Volume:
10
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/10/05/p05010
Date:
May, 2015
File:
PDF, 4.11 MB
english, 2015
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