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[IEEE 2016 American Control Conference (ACC) - Boston, MA, USA (2016.7.6-2016.7.8)] 2016 American Control Conference (ACC) - On-chip atomic force microscopy: Mechatronic system design and control
Moheimani, S. O. Reza, Fowler, Anthony, Maroufi, Mohammad, Ruppert, MichaelYear:
2016
Language:
english
DOI:
10.1109/acc.2016.7525391
File:
PDF, 128 KB
english, 2016