[IEEE 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS) - Vienna, Austria (2016.8.1-2016.8.3)] 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS) - Thresholds for Size and Complexity Metrics: A Case Study from the Perspective of Defect Density
Yamashita, Kazuhiro, Huang, Changyun, Nagappan, Meiyappan, Kamei, Yasutaka, Mockus, Audris, Hassan, Ahmed E., Ubayashi, NaoyasuYear:
2016
Language:
english
DOI:
10.1109/qrs.2016.31
File:
PDF, 699 KB
english, 2016