Thickness and oxygen partial pressure dependence on optical...

IOP Conference Series Materials Science and Engineering 2015 / 02 Vol. 73

Thickness and oxygen partial pressure dependence on optical band gap of indium oxide by reactive evaporation method

Ali, A V Muhammed, Kekuda, Dhananjaya
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Volume:
73
Language:
english
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/73/1/012027
Date:
February, 2015
File:
PDF, 943 KB
english, 2015
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