Decomposition characteristics of SF 6 under three typical defects and the diagnostic application of triangle method
Zhong, Lipeng, Ji, Shengchang, Liu, Kai, Xiong, Qing, Zhu, LingyuVolume:
23
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/tdei.2016.7736817
Date:
October, 2016
File:
PDF, 1.75 MB
english, 2016