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A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging
Brown, H.G., Ishikawa, R., Sánchez-Santolino, G., Lugg, N.R., Ikuhara, Y., Allen, L.J., Shibata, N.Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.11.024
Date:
November, 2016
File:
PDF, 761 KB
english, 2016