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A novel wafer-scale CMOS APS X-ray detector for breast cancer diagnosis using X-ray diffraction studies
Konstantinidis, A, Zheng, Y, Philip, D, Vinnicombe, S, Speller, RVolume:
7
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/7/12/C12005
Date:
December, 2012
File:
PDF, 1020 KB
english, 2012