An ionization method of monitoring the relative thickness...

An ionization method of monitoring the relative thickness of the collector of planar transistor structures

E. R. Astvatsatur'yan, P. K. Skorobogatov, A. A. Tomchuk
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Volume:
27
Language:
english
Pages:
3
DOI:
10.1007/bf00838773
Date:
June, 1984
File:
PDF, 216 KB
english, 1984
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