SiC JFET dc characteristics under extremely high ambient temperatures
Funaki, Tsuyoshi, Balda, Juan C., Junghans, Jeremy, Kashyap, Avinash S., Barlow, Fred D., Mantooth, H. Alan, Kimoto, Tsunenobu, Hikihara, TakashiVolume:
1
Year:
2004
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.1.523
File:
PDF, 257 KB
english, 2004