Study of charge retention mechanism for DNA memory FET

IEICE Electronics Express 2014 Vol. 11; Iss. 5

Study of charge retention mechanism for DNA memory FET

Maeno, Shoko, Matsuo, Naoto, Nakamura, Shohei, Heya, Akira, Takada, Tadao, Yamana, Kazushige, Fukuyama, Masataka, Yokoyama, Shin
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Volume:
11
Year:
2014
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.11.20130900
File:
PDF, 1.73 MB
english, 2014
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