Effect of charge sharing on SEU sensitive area of 40-nm 6T...

IEICE Electronics Express 2014 Vol. 11; Iss. 4

Effect of charge sharing on SEU sensitive area of 40-nm 6T SRAM cells

Li, Peng, Zhang, Minxuan, Zhang, Weicheng, Zhao, Zhenyu, Song, Chao, Fan, Hua
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Volume:
11
Year:
2014
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.11.20140051
File:
PDF, 701 KB
english, 2014
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