Research on single-event transient mechanism in a novel SOI...

IEICE Electronics Express 2014 Vol. 11; Iss. 18

Research on single-event transient mechanism in a novel SOI CMOS technology

Zhang, Chao, Chen, Jianjun, Chi, Yaqing, Yang, Hui
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Volume:
11
Year:
2014
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.11.20140518
File:
PDF, 2.82 MB
english, 2014
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