Robust C-element design for soft-error mitigation

IEICE Electronics Express 2015 Vol. 12; Iss. 10

Robust C-element design for soft-error mitigation

Wey, I-Chyn, Wu, Bing-Chen, Peng, Chien-Chang, Gong, Cihun-Siyong Alex, Yu, Chang-Hong
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Volume:
12
Year:
2015
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.12.20150268
File:
PDF, 1.64 MB
english, 2015
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