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Reduced-code test method using sub-histograms for pipelined ADCs
Son, Hyeonuk, Jang, Jaewon, Kim, Heetae, Kang, SunghoVolume:
12
Year:
2015
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.12.20150417
File:
PDF, 3.04 MB
english, 2015