Profiling attack using multivariate regression analysis
Sugawara, Takeshi, Homma, Naofumi, Aoki, Takafumi, Satoh, AkashiVolume:
7
Year:
2010
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.7.1139
File:
PDF, 459 KB
english, 2010