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Investigation of breakdown voltage in InAlAs/InGaAs/InP HEMTs with different structures
Ohadi, Sahar, Faez, Rahim, Hoseini, Hamid RezaVolume:
7
Year:
2010
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.7.1447
File:
PDF, 839 KB
english, 2010