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Characterization of the gate-voltage dependency of input capacitance in a SiC MOSFET
Phankong, Nathabhat, Funaki, Tsuyoshi, Hikihara, TakashiVolume:
7
Year:
2010
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.7.480
File:
PDF, 477 KB
english, 2010