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Selective etching of HfN gate electrode for HfN/HfSiON gate stack in-situ formations
Sano, Takahiro, Ohmi, Shun-ichiroVolume:
8
Year:
2011
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.8.1492
File:
PDF, 612 KB
english, 2011